VT AFM/STM

VT BeetleTM
 RHK VT Beetle microscopes offer STM and beam-deflection Contact and NC-AFM, and sample temperatures from 25 K to >1500 K on the sample stage. RHK has modified Beetle systems to provide Variable Magnetic Fields, specialized Optical access for beam studies and TERS, and SEM-guided probe positioning. A wide variety of surface preparation and analysis instruments and chambers are provided and integrated by RHK to complement Beetle systems.•Inherently Stable: Ultra Low Drift

•Full Range Contact & NC-AFM
•Open Optical Access: Multiple Viewing Angles
•6 Electrical Contacts: TC, Heating, BEEM, etc.
•Variable Magnetic Field