VT UHV 4-Probe SPM USM-1400-4P

Features


Sample holder and probe holders can be exchanged in UHV
Variable temperature: from 3.5K to 80K using liquid helium, 80K to RT using liquid nitrogen
Sample stage can be adjusted by 3mm in XY direction
Each probe position can be adjusted by 3mm in XYZ direction by computer controlled piezo stages
STM or AFM probes can be set on any probe stages
All 4 probe stages can be scanned in atomic resolution

Applications

4 point conductivity measurement on thin film, nano wire, etc.
Measurement of local property of the devices
Local potentiometry of nano structure
STM/AFM imaging by each probe
Further applications of SEM analysis
Optical or electron beam excited conductivity measurement