Non-contact testing for sheet resistance and thickness (Lab2020SR)
The EddyCus ® TF map 2020SR is a fast non-contact sheet resistance mapping system for conductive thin films, and also for layer thickness mapping of
metal films. Typical applications are the quality assurance of TCOs, metals films, graphene, CNT and metal nano wires or grids. The system is highly beneficial for
the quality assessment of deposition, annealing, and doping processes. The EddyCus ® TF map 2020SR allows a quick mapping of samples sizes up to 8 inches.
The measured values are immediately displayed in the easy to handle software.